X-Ray Fluorescence Analysis of Gemstones
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چکیده
The energy dispersive X-ray fluorescence analysis (ED-XRFA) is a well-established tool for multielement composition analysis in different fields/1/. It works non-conducting and it is non-destructive. No particular sample preparation is necessary if the specimens have an almost planar and smooth surface. For the characterization of precious gemstone material it is also important that the deposited X-ray radiation dose is definitely too weak for inducing colour alterations, in contrast to WD-XRFA /2/. This is essential for gemstone testing. The concentrations of the major and minor and the trace elements give important hints for the type and/or the authenticity of the gemstone. In this way ED-XRFA becomes essential for the identification of the mineral in addition to structural analysis (Raman, XRD) and classic optical methods.
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